BENGALURU, India – 17/12/2025 – G-Hexa Research Center, a specialized research solutions provider, today announced a significant expansion of its Material Characterization and Failure Analysis portfolio. This strategic initiative is designed to bridge the gap between advanced analytical technology and industrial application, providing researchers and manufacturers in India with streamlined access to high-end microstructure analysis.
As the demand for lighter, stronger, and more durable materials grows in sectors like Aerospace, Defence, and Semiconductors, the need for atomic-level inspection has become critical. G-Hexa Research Center addresses this need by aggregating and managing top-tier characterization capabilities, including the rare and highly specialized Atom Probe Tomography (APT), which has traditionally been difficult for small-to-mid-sized enterprises (SMEs) and academic researchers to access.
“We are witnessing a surge in inquiries for complex failure analysis where engineers need to pinpoint exactly why a metal component fractured or a thin film delaminated,” said Mahesh Reddy CMO at G-Hexa Research Center. “By expanding our service capabilities to include APT and FESEM (Field Emission Scanning Electron Microscopy), we are enabling our clients to obtain high-fidelity, atomic-scale data without the burden of maintaining heavy infrastructure.”
Key Services Now Available via G-Hexa:
The expanded portfolio focuses on high-precision metallurgical testing and non-destructive evaluation (NDE):
Atom Probe Tomography (APT): Offering 3D atomic-scale reconstruction and compositional analysis. This is essential for studying grain boundaries, clustering, and nano-precipitates in superalloys and semiconductors.
FESEM & TEM Imaging: Providing high-resolution surface and internal structure imaging for nanomaterials and biological samples.
Root Cause Failure Analysis: A systematic investigation service using fractography and chemical profiling to identify causes of failure such as fatigue, corrosion, stress overload, or manufacturing defects.
X-Ray Diffraction (XRD): For precise phase identification, crystallinity checks, and residual stress measurement in metals and ceramics.
Elemental Mapping (EDS): Quantitative chemical analysis to detect impurities and verify alloy compositions.
G-Hexa aims to serve as a technical catalyst for Indian innovation, reducing turnaround times for critical R&D projects. The center is currently accepting samples from across India and provides comprehensive digital reporting for remote clients, ensuring that geography is no longer a barrier to high-quality material characterization.
“Our mission is to democratize access to advanced science,” added Mahesh Reddy. “Whether a client needs a single high-res TEM image or a complete failure investigation report, G-Hexa provides the technical expertise and logistical support to deliver accurate results.”
For detailed service specifications and submission guidelines,
Website: https://g-hexa.com/characterization/
About G-Hexa Research Center
G-Hexa Research Center is a private research solutions company based in Bengaluru, India. We specialize in consulting and facilitating advanced analytical testing for academic institutions and industrial partners. Our expertise covers a wide spectrum of material science services, including APT, FESEM, TEM, AFM, and XRD, serving the aerospace, defense, and manufacturing sectors.
Mahesh Reddy
G-Hexa Research Center PVT LTD
info@g-hexa.com
+91 72593 61109
https://g-hexa.com/characterization/
G-Hexa Research Center announces the expansion of its specialized technical services in India, now providing access to Atom Probe Tomography (APT), FESEM, and advanced Failure Analysis for the aerospace, automotive, and electronics industries.
*press release picked from openpr https://www.openpr.com/news/4319198/g-hexa-research-center-expands-material-characterization
